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A FAIR Principle Data Model for Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) and the Frederick National Laboratory Data Coordinating Center. (August 2019)
Record Type:
Journal Article
Title:
A FAIR Principle Data Model for Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) and the Frederick National Laboratory Data Coordinating Center. (August 2019)
Main Title:
A FAIR Principle Data Model for Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) and the Frederick National Laboratory Data Coordinating Center