A FAIR Principle Data Model for Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) and the Frederick National Laboratory Data Coordinating Center. (August 2019) - Aiyetan, Paul; Narayan, Kedar; Mott, David; Kuchipudi, Rajani; Zeitler, Corinne; Hope, Debra; Mudunuri, Uma; Quong, Andrew