Cite
APA Citation
Jawaharram, G. S., Barr, C., Price, P., Hattar, K., & Dillon, S. J. (n.d.). in situ TEM Measurements of Ion Irradiation Induced Creep. Microscopy and microanalysis, 25, 1566–1567. http://access.bl.uk/ark:/81055/vdc_100145643131.0x000031