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APA Citation
Allen, F. I., Pekin, T. C., Persaud, A., Rozeveld, S. J., Meyers, G. F., Ciston, J., Ophus, C., & Minor, A. M. (n.d.). high Throughput Grain Mapping with Sub-Nanometer Resolution by 4D-STEM. Microscopy and microanalysis, 25, 1960–1961. http://access.bl.uk/ark:/81055/vdc_100145642902.0x000047