Electron Ptychography Using Fast Binary 4D STEM Data. (August 2019)
- Record Type:
- Journal Article
- Title:
- Electron Ptychography Using Fast Binary 4D STEM Data. (August 2019)
- Main Title:
- Electron Ptychography Using Fast Binary 4D STEM Data
- Authors:
- O'Leary, Colum M.
Liberti, Emanuela
Collins, Sean M.
Johnstone, Duncan N.
Rothmann, Mathias
Hou, Jingwei
Allen, Christopher S.
Kim, Judy S.
Bennett, Thomas D.
Midgley, Paul A.
Kirkland, Angus I.
Nellist, Peter D. - Abstract:
- Is Part Of:
- Microscopy and microanalysis. Volume 25:(2022)Supplement 2
- Journal:
- Microscopy and microanalysis
- Issue:
- Volume 25:(2022)Supplement 2
- Issue Display:
- Volume 25, Issue 2 (2019)
- Year:
- 2019
- Volume:
- 25
- Issue:
- 2
- Issue Sort Value:
- 2019-0025-0002-0000
- Page Start:
- 1662
- Page End:
- 1663
- Publication Date:
- 2019-08
- Subjects:
- Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82 - Journal URLs:
- https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗ - DOI:
- 10.1017/S1431927619009048 ↗
- Languages:
- English
- ISSNs:
- 1431-9276
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD Digital store
- Ingest File:
- 20023.xml