Electron Ptychography Using Fast Binary 4D STEM Data. (August 2019) - O'Leary, Colum M.; Liberti, Emanuela; Collins, Sean M.; Johnstone, Duncan N.; Rothmann, Mathias; Hou, Jingwei; Allen, Christopher S.; Kim, Judy S.; Bennett, Thomas D.; Midgley, Paul A.; Kirkland, Angus I.; Nellist, Peter D.