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APA Citation
Fu, B., Parson, T., Das, A., Deangelo, M., & Appiah-Amponsah, E. (n.d.). a Combination of Un-supervised and Supervised Machine Learning Method for Auto-thresholding Scanning Electron Microscopy Images. Microscopy and microanalysis, 25, 204–205. http://access.bl.uk/ark:/81055/vdc_100145642800.0x000016