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APA Citation
Li, M., Curnan, M. T., Cresh-Sill, M. A., House, S. D., Saidi, W. A., & Yang, J. C. (n.d.). atomic Scale Dynamic Process of Cu Oxidation Revealed By Correlated in situ Environmental TEM and DFT Simulations. Microscopy and microanalysis, 25, 1494–1495. http://access.bl.uk/ark:/81055/vdc_100145642800.0x000010