Cite
APA Citation
Rudinsky, S., Yuan, Y., Gauvin, R., Piché, N., & Marsh, M. (n.d.). extending Monte Carlo Simulations of Electron Microscopy Images and Hyperspectral Images in a User-Friendly Framework. Microscopy and microanalysis, 25, 222–223. http://access.bl.uk/ark:/81055/vdc_100145642800.0x00000c