Cite
APA Citation
Choi, I. (., & Jeong, C. (2021). remote embedded devices test framework on the cloud. Software testing, verification & reliability, 31, n/a. http://access.bl.uk/ark:/81055/vdc_100145464574.0x000029
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Choi, I. (., & Jeong, C. (2021). remote embedded devices test framework on the cloud. Software testing, verification & reliability, 31, n/a. http://access.bl.uk/ark:/81055/vdc_100145464574.0x000029