Cite
MLA Citation
Dibyesh Shrestha et al.. “Electron Microscopy and Spectroscopy Characterization of the Effects of Annealing on the Cu/Graphene/Si Multilayer Thin Films.” Microscopy and microanalysis, vol. 25, n.d., pp. 1918–1919. http://access.bl.uk/ark:/81055/vdc_100145642665.0x00003d