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APA Citation
Melul, F., Marca, V. D., Bocquet, M., Akbal, M., Laine, P., Trenteseaux, F., Mantelli, M., Hesse, M., Regnier, A., Niel, S., & La Rosa, F. (2021). morphology and reliability aspects of 40 nm eSTM™ architecture. Microelectronics and reliability, 126, . http://access.bl.uk/ark:/81055/vdc_100146764431.0x00005a