Cite
HARVARD Citation
Wu, R. et al. (2021). Measurement and simulation of short circuit current sharing under parallel connection: SiC MOSFETs and SiC Cascode JFETs. Microelectronics and reliability. p. . [Online].
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Wu, R. et al. (2021). Measurement and simulation of short circuit current sharing under parallel connection: SiC MOSFETs and SiC Cascode JFETs. Microelectronics and reliability. p. . [Online].