Electronics reliability assessment of future power fusion machines: Neutron interaction analysis in bulk silicon. (November 2021)
- Record Type:
- Journal Article
- Title:
- Electronics reliability assessment of future power fusion machines: Neutron interaction analysis in bulk silicon. (November 2021)
- Main Title:
- Electronics reliability assessment of future power fusion machines: Neutron interaction analysis in bulk silicon
- Authors:
- Autran, J.L.
Munteanu, D. - Abstract:
- Abstract: The interactions of high energy neutrons produced in D-D and D-T nuclear fusion reactions with natural silicon have been investigated through direct calculation using nuclear cross section libraries, MCNP6 and Geant4 numerical simulations. From the systematic simulation and particle tracking of 5×10 8 neutrons incident on a 1 cm 2 ×20 μm bulk target, we provide a detailed analysis of all interactions (elastic, inelastic, nonelastic) per type of reacting silicon isotope and an exhaustive classification of all neutron-induced secondary products as a function of their type, energy, linear energy transfer and range in silicon. Implications for reliability of the electronics in future power fusion machines are discussed based on these first evaluations. Highlights: Interactions between natural silicon, 2.45 MeV and 14 MeV neutrons are studied. At 14 MeV, 40% of elastic, 30% of inelastic and 30% of nonelastic events are produced. At 2.45 MeV, 75% of elastic, 25% of inelastic and no nonelastic events are produced. Implications for reliability assessment of the electronics in future power fusion machines are discussed.
- Is Part Of:
- Microelectronics and reliability. Volume 126(2021)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 126(2021)
- Issue Display:
- Volume 126, Issue 2021 (2021)
- Year:
- 2021
- Volume:
- 126
- Issue:
- 2021
- Issue Sort Value:
- 2021-0126-2021-0000
- Page Start:
- Page End:
- Publication Date:
- 2021-11
- Subjects:
- D-D neutron -- Neutron interactions -- Natural silicon -- Silicon isotopes -- Geant4 -- MCNP6 -- SRIM -- ENDF/B-VII.1 -- Soft-error rate -- Single event upset
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2021.114223 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 19993.xml