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APA Citation
Simon-Najasek, M., Diehle, P., Große, C., Hübner, S., Brokmann, G., Sprenger, B., & Altmann, F. (2021). local metal segregation as root cause for electrical shorts in highly doped pressure sensor devices. Microelectronics and reliability, 126, . http://access.bl.uk/ark:/81055/vdc_100146761129.0x000057