A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics. (November 2021)
- Record Type:
- Journal Article
- Title:
- A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics. (November 2021)
- Main Title:
- A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics
- Authors:
- Phoulady, Adrian
May, Nicholas
Choi, Hongbin
Shahbazmohamadi, Sina
Tavousi, Pouya - Abstract:
- Abstract: Ultrashort pulsed lasers can offer athermal, fast and precise material removal as needed for inspection, failure analysis, and reverse engineering of microelectronics. Laser parameters must be fine-tuned, based on material type, for best results. However, often, accurate information about the material composition of sample of interest is not at hand and thus the material composition must be inferred. Furthermore, endpointing of the deprocessing system becomes increasingly difficult due to the large material removal rate of laser systems. Integration of current methods, such as energy dispersive spectroscopy (EDS) and laser induced breakdown spectroscopy (LIBS), is expensive and complex. We propose a novel technique that detects material composition based on surface texture parameters derived from confocal images of a lasered area. A multilayer fully connected neural network is used, which after sufficient training can predict the material composition of the sample with a single image of the surface. Highlights: Novel material detection utilizing ultrashort pulsed laser, confocal microscopy, and machine learning. Automated sample preparation using AI-enabled end pointing. Leveraging laser material interaction for real time characterization and enhancement of laser based material removal.
- Is Part Of:
- Microelectronics and reliability. Volume 126(2021)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 126(2021)
- Issue Display:
- Volume 126, Issue 2021 (2021)
- Year:
- 2021
- Volume:
- 126
- Issue:
- 2021
- Issue Sort Value:
- 2021-0126-2021-0000
- Page Start:
- Page End:
- Publication Date:
- 2021-11
- Subjects:
- Material detection -- Machine learning -- Ultra-short pulsed laser -- Confocal microscopy -- Image processing -- End pointing
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2021.114287 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
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British Library HMNTS - ELD Digital store - Ingest File:
- 19993.xml