Custom measurement system for memristor characterisation. (December 2021)

• Record Type: Journal Article
• Authors: Lupo, F.V.; Scirè, D.; Mosca, M.; Crupi, I.; Razzari, L.; Macaluso, R.
• Is Part Of: Solid-state electronics. Volume 186(2021)
• Publication Date: 2021-12
• Subjects: Memristor -- ReRAM -- Electrical characterization system -- Current compliance -- Endurance -- Retention; Semiconductors -- Periodicals; Semiconducteurs -- Périodiques; 621.38152
• DOI: 10.1016/j.sse.2021.108049
• Languages: English
• ISSNs: 0038-1101

Abstract

Highlights: Cheap and easily customisable memristors electrical characterisation system. Capability of performing retention, endurance and DC sweeps measurements. Capability of imposing a fine-tuneable current compliance. Abstract: A cheap, compact and customisable characterisation system for memristor devices, working between ± 10 V, is presented. SPICE (Simulation Program with Integrated Circuit Emphasis) simulations are performed to verify the circuit feasibility and a proper software is developed to drive the system. The potentiality of the realised system is tested by performing several electrical measurements on both Cu/HfO2 /Pt memristors and two-terminals commercial devices.