Cite
APA Citation
Leppänen, J., Ross, G., Vuorinen, V., Ingman, J., Jormanainen, J., & Paulasto-Kröckel, M. (2021). a humidity-induced novel failure mechanism in power semiconductor diodes. Microelectronics and reliability, 123, . http://access.bl.uk/ark:/81055/vdc_100137795616.0x00005e