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APA Citation
Verma, H., Le Guen, K., Delaunay, R., Ismail, I., Ilakovac, V., Rueff, J. P., Zheng, Y. J., & Jonnard, P. (2021). study of buried interfaces in Fe/Si multilayer by hard x‐ray emission spectroscopy. Surface and interface analysis, 53, 1043–1047. http://access.bl.uk/ark:/81055/vdc_100145641470.0x000053