Cite
MLA Citation
Ze Feng et al.. “Ferroelectric‐Like Behavior in TaN/High‐k/Si System Based on Amorphous Oxide.” Advanced Electronic Materials, vol. 7, 2021, p. n/a. http://access.bl.uk/ark:/81055/vdc_100144250943.0x000008
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Ze Feng et al.. “Ferroelectric‐Like Behavior in TaN/High‐k/Si System Based on Amorphous Oxide.” Advanced Electronic Materials, vol. 7, 2021, p. n/a. http://access.bl.uk/ark:/81055/vdc_100144250943.0x000008