Cite
HARVARD Citation
Magnone, P. et al. (2021). Understanding the impact of split-gate LDMOS transistors: Analysis of performance and hot-carrier-induced degradation. Solid-state electronics. p. . [Online].
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Magnone, P. et al. (2021). Understanding the impact of split-gate LDMOS transistors: Analysis of performance and hot-carrier-induced degradation. Solid-state electronics. p. . [Online].