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APA Citation
Torrente, G., Coignus, J., Renard, S., Vernhet, A., Reimbold, G., Roy, D., & Ghibaudo, G. (2015). physically-based extraction methodology for accurate MOSFET degradation assessment. Microelectronics and reliability, 55(9), 1417–1421. http://access.bl.uk/ark:/81055/vdc_100051209826.0x000058