Cite
HARVARD Citation
Yap, H. et al. (2015). Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique. Microelectronics and reliability. 55 (9), pp. 1611-1616. [Online].
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Yap, H. et al. (2015). Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique. Microelectronics and reliability. 55 (9), pp. 1611-1616. [Online].