Lifetime estimation of high-temperature high-voltage polymer film capacitor based on capacitance loss. Issue 9 (August 2015)
- Record Type:
- Journal Article
- Title:
- Lifetime estimation of high-temperature high-voltage polymer film capacitor based on capacitance loss. Issue 9 (August 2015)
- Main Title:
- Lifetime estimation of high-temperature high-voltage polymer film capacitor based on capacitance loss
- Authors:
- Makdessi, M.
Sari, A.
Venet, P.
Aubard, G.
Chevalier, F.
Préseau, R.
Doytchinov, T.
Duwattez, J. - Abstract:
- Abstract: Under steady voltage and temperature stresses, capacitance can be considered as a reliable aging indicator since in such conditions, metallized polymer film capacitors suffer from the gradual loss of their electrode surface. Empirical laws are most often considered to predict the operating lifetime of energy storage systems under specific environmental conditions. However, expected lifetimes in this case are not able to track the capacitors degradation with time. In this paper, a special capacitance degradation model is proposed based on several experimental aging tests at different temperatures and voltage stresses. A total of 30 capacitors using a novel high-voltage high-temperature (HVHT) polymer as dielectric have been studied and compared to validate the proposed law. This novel HVHT polymer offers significant improvements upon the standard dielectric materials, providing excellent self-healing capability with an enhanced energy density. Highlights: Novel aging law for metallized film capacitors Capacitance increase and loss can be taken into account. Can be generalized for different voltage and temperature of use Tested on a new high voltage and high temperature polymer
- Is Part Of:
- Microelectronics and reliability. Volume 55:Issue 9/10(2015)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 55:Issue 9/10(2015)
- Issue Display:
- Volume 55, Issue 9/10 (2015)
- Year:
- 2015
- Volume:
- 55
- Issue:
- 9/10
- Issue Sort Value:
- 2015-0055-NaN-0000
- Page Start:
- 2012
- Page End:
- 2016
- Publication Date:
- 2015-08
- Subjects:
- Metallized film capacitors -- Aging -- Failure analysis -- Aging law -- Remaining useful life
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2015.06.099 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 19309.xml