Design for built-in FPGA reliability via fine-grained 2-D error correction codes. Issue 9 (August 2015)

• Record Type: Journal Article
• Authors: Ahilan, A.; Deepa, P.
• Is Part Of: Microelectronics and reliability. Volume 55:Issue 9/10(2015)
• Page Start: 2108
• Page End: 2112
• Publication Date: 2015-08
• Subjects: Built-in reliability -- SRAM -- Field programmable gate array -- Encode–COMPARE -- Error correction; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2015.06.075
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: Radiation-induced multiple bit upsets (MBUs) degrade the reliability of scaled static random access memory (SRAM)-based field programmable gate arrays (FPGAs). Reducing the correction time for MBU and preventing the error accumulation are the challenges faced by error correction code (ECC) integrated FPGAs. In this paper, a novel built-in ECC using encode-and-compare of the data and parity bits is proposed to reduce the correction time and improve the reliability of FPGA. Implementation has been carried out in FPGA to confirm its effectiveness. The proposed method is 5 times faster than existing CRC based inbuilt error mitigation solution. This work opens a door for 2-D ECC to be universally used in FPGAs for safety-critical applications. Highlights: Encode-and-compare scheme reduces the error correction process delay. Fine grain ECC optimizes the overall delay and the reliability. Novel built-in ECC solution avoids the accumulation of soft error in configuration memory. Integrated novel built-in ECC for MBU tolerant FPGAs 5 times faster than existing CRC based inbuilt error mitigation solution