Cite
APA Citation
Zobiri, O., Atia, A., & Arıcı, M. (2021). a critical evaluation based on Lattice Boltzmann method of nanoscale thermal behavior inside MOSFET and SOI-MOSFET. Microelectronics journal, 115, . http://access.bl.uk/ark:/81055/vdc_100140204736.0x000052