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HARVARD Citation
Zobiri, O. et al. (2021). A critical evaluation based on Lattice Boltzmann method of nanoscale thermal behavior inside MOSFET and SOI-MOSFET. Microelectronics journal. p. . [Online].
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Zobiri, O. et al. (2021). A critical evaluation based on Lattice Boltzmann method of nanoscale thermal behavior inside MOSFET and SOI-MOSFET. Microelectronics journal. p. . [Online].