Cite
HARVARD Citation
Kim, H. et al. (n.d.). Spatial variation in local work function as an origin of moiré contrast in scanning tunneling microscopy images of Pb thin films/Si(111). Japanese journal of applied physics. p. . [Online].
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Kim, H. et al. (n.d.). Spatial variation in local work function as an origin of moiré contrast in scanning tunneling microscopy images of Pb thin films/Si(111). Japanese journal of applied physics. p. . [Online].