Cite
MLA Citation
Frances I. Allen et al.. “Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization.” Microscopy and microanalysis, vol. 27, 2021, pp. 794–803. http://access.bl.uk/ark:/81055/vdc_100139600717.0x000026