Cite
MLA Citation
Lucia Spasevski et al.. “Quantification of Trace-Level Silicon Doping in AlxGa1–xN Films Using Wavelength-Dispersive X-Ray Microanalysis.” Microscopy and microanalysis, vol. 27, 2021, pp. 696–704. http://access.bl.uk/ark:/81055/vdc_100139600659.0x000014