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APA Citation
Zhang, C., Baraissov, Z., Duncan, C., Hanuka, A., Edelen, A., Maxson, J., & Muller, D. (2021). aberration Corrector Tuning with Machine-Learning-Based Emittance Measurements and Bayesian Optimization. Microscopy and microanalysis, 27, 810–812. http://access.bl.uk/ark:/81055/vdc_100136720353.0x000042