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MLA Citation
Hongbin Yang et al.. “A new planar defect in SiGe nanopillars.” Microscopy and microanalysis, vol. 27, 2021, pp. 1948–1949. http://access.bl.uk/ark:/81055/vdc_100136720134.0x00003a
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Hongbin Yang et al.. “A new planar defect in SiGe nanopillars.” Microscopy and microanalysis, vol. 27, 2021, pp. 1948–1949. http://access.bl.uk/ark:/81055/vdc_100136720134.0x00003a