Cite
APA Citation
Cimmino, D., Busca, R., Ferrero, S., Pirri, F., Richieri, G., & Carta, R. (2019). high Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices. Microelectronics and reliability, 100, . http://access.bl.uk/ark:/81055/vdc_100098425194.0x00005e