Cite
HARVARD Citation
Cimmino, D. et al. (2019). High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices. Microelectronics and reliability. p. . [Online].
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Cimmino, D. et al. (2019). High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices. Microelectronics and reliability. p. . [Online].