Cite
HARVARD Citation
Aguiar, Y. et al. (2019). Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells. Microelectronics and reliability. p. . [Online].
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Aguiar, Y. et al. (2019). Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells. Microelectronics and reliability. p. . [Online].