Cite
HARVARD Citation
Zagni, N. et al. (2019). Insights into the off-state breakdown mechanisms in power GaN HEMTs. Microelectronics and reliability. p. . [Online].
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Zagni, N. et al. (2019). Insights into the off-state breakdown mechanisms in power GaN HEMTs. Microelectronics and reliability. p. . [Online].