Cite
HARVARD Citation
Pomeranz, I. (2016). Static test compaction for circuits with multiple independent scan chains. IET computers & digital techniques. 10 (1), pp. 12-17. [Online].
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Pomeranz, I. (2016). Static test compaction for circuits with multiple independent scan chains. IET computers & digital techniques. 10 (1), pp. 12-17. [Online].