Static test compaction for circuits with multiple independent scan chains. Issue 1 (1st January 2016)

• Record Type: Journal Article
• Authors: Pomeranz, Irith
• Is Part Of: IET computers & digital techniques. Volume 10:Issue 1(2016)
• Page Start: 12
• Page End: 17
• Publication Date: 2016-01-01
• Subjects: circuit testing -- fault diagnosis; circuit static test compaction procedure -- independent scan chains -- transition faults -- shift mode -- functional mode -- skewed‐load tests -- fault coverage -- broadside tests; Computers -- Periodicals; Digital electronics -- Periodicals; Computer engineering -- Periodicals; Computer architecture -- Periodicals; Computer organization -- Periodicals; 621.39
• DOI: 10.1049/iet-cdt.2014.0191
• Languages: English
• ISSNs: 1751-8601

Abstract

Abstract : This study describes a static test compaction procedure for transition faults in circuits with multiple scan chains where each scan chain can operate independently in functional or shift mode. The procedure mixes parts of different broadside and skewed‐load tests, where the parts coincide with the scan chains, in order to create new tests that detect more faults. This allows the number of tests to be reduced without reducing the fault coverage. By mixing parts of tests with different types, different scan chains are assigned different modes of operation within the same test. Experimental results are presented to demonstrate that this allows the number of tests to be reduced below the number of tests in a compact test set that consists of broadside and skewed‐load tests.