Design topologies with dual‐Vth and dual‐Tox assignment in 16 nm CMOS technology. Issue 4 (30th April 2020)
- Record Type:
- Journal Article
- Title:
- Design topologies with dual‐Vth and dual‐Tox assignment in 16 nm CMOS technology. Issue 4 (30th April 2020)
- Main Title:
- Design topologies with dual‐Vth and dual‐Tox assignment in 16 nm CMOS technology
- Authors:
- Singhal, Smita
Mehra, Anu
Tripathi, Upendra - Abstract:
- Abstract : This study presents different topologies for the assignment of dual threshold voltage and dual gate oxide thickness in 16 nm complementary metal‐oxide‐semiconductor technology. The objective is to optimise the circuit in terms of static power dissipation, delay, and power‐delay‐product (pdp). Topologies namely direct, grouping, and divide‐by‐2 are simulated for ( A + B ) ⋅ C ¯ and conventional 1‐bit full adder circuits. Results of the proposed topologies are compared with some of the existing techniques of leakage reduction i.e. dual‐ V th, dual‐ T ox and supply switching with ground collapse (SSGC). 1‐bit full adder circuit using direct topology reduces static power to 99.98, 96.71, and 95.86% as compared to static power in dual‐ V th, dual‐ T ox, and SSGC techniques, respectively. The pdp of the circuit is significantly improved using proposed topologies. Thus, these topologies can be used for low power and high‐performance applications with no area overhead.
- Is Part Of:
- IET computers & digital techniques. Volume 14:Issue 4(2020)
- Journal:
- IET computers & digital techniques
- Issue:
- Volume 14:Issue 4(2020)
- Issue Display:
- Volume 14, Issue 4 (2020)
- Year:
- 2020
- Volume:
- 14
- Issue:
- 4
- Issue Sort Value:
- 2020-0014-0004-0000
- Page Start:
- 176
- Page End:
- 186
- Publication Date:
- 2020-04-30
- Subjects:
- low‐power electronics -- leakage currents -- CMOS logic circuits -- adders -- circuit optimisation -- logic design -- integrated circuit design -- network topology
adder circuit -- direct topology -- design topologies -- CMOS technology -- dual threshold voltage -- dual gate oxide thickness -- complementary metal‐oxide‐semiconductor technology -- static power dissipation -- power‐delay‐product -- dual‐Tox assignment -- dual‐Vth assignment -- leakage reduction -- supply switching with ground collapse -- SSGC techniques -- high‐performance applications -- low power applications -- circuit optimisation -- size 16.0 nm -- word length 1 bit
Computers -- Periodicals
Digital electronics -- Periodicals
Computer engineering -- Periodicals
Computer architecture -- Periodicals
Computer organization -- Periodicals
621.39 - Journal URLs:
- http://digital-library.theiet.org/content/journals/iet-cdt ↗
http://ieeexplore.ieee.org/servlet/opac?punumber=4117424 ↗
http://www.ietdl.org/IET-CDT ↗
https://ietresearch.onlinelibrary.wiley.com/journal/1751861x ↗
http://www.theiet.org/ ↗ - DOI:
- 10.1049/iet-cdt.2018.5211 ↗
- Languages:
- English
- ISSNs:
- 1751-8601
- Deposit Type:
- Legaldeposit
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- Available online (eLD content is only available in our Reading Rooms) ↗
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- British Library DSC - 4363.252300
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- 17393.xml