Cite
APA Citation
Tyaginov, S., Makarov, A., Chasin, A., Bury, E., Vandemaele, M., Jech, M., Grill, A., De Keersgieter, A., Linten, D., & Kaczer, B. (2021). the impact of self-heating and its implications on hot-carrier degradation – A modeling study. Microelectronics and reliability, 122, . http://access.bl.uk/ark:/81055/vdc_100132602640.0x000059