Cite
HARVARD Citation
Tyaginov, S. et al. (2021). The impact of self-heating and its implications on hot-carrier degradation – A modeling study. Microelectronics and reliability. p. . [Online].
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Tyaginov, S. et al. (2021). The impact of self-heating and its implications on hot-carrier degradation – A modeling study. Microelectronics and reliability. p. . [Online].