A SiGe BiCMOS Instrumentation Channel for Extreme Environment Applications. (16th February 2010)

• Record Type: Journal Article
• Authors: Ulaganathan, Chandradevi; Nambiar, Neena; Cornett, Kimberly; Greenwell, Robert L.; Yager, Jeremy A.; Prothro, Benjamin S.; Tham, Kevin; Chen, Suheng; Broughton, Richard S.; Fu, Guoyuan; Blalock, Benjamin J.; Britton, Charles L.; Ericson, M. Nance; Mantooth, H. Alan; Mojarradi, Mohammad M.; Berger, Richard W.; Cressler, John D.
• Other Names: Farquhar Ethan Academic Editor.
• Is Part Of: VLSI design. Volume 2010(2010)
• Publication Date: 2010-02-16
• Subjects: Integrated circuits -- Very large scale integration -- Periodicals; 621.395
• DOI: 10.1155/2010/156829
• Languages: English
• ISSNs: 1065-514X

Abstract

Abstract : An instrumentation channel is designed, implemented, and tested in a 0.5-μ m SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces an assortment of external sensors to signal processing circuits. Also, analog sampling is implemented in the channel using a flying capacitor configuration. The analog samples are digitized by a low-power multichannel A/D converter. Measurement results show that the instrumentation channel supports input signals up to 200 Hz and operates across a wide temperature range of - 180 ° C to 125 ° C . This work demonstrates the use of a commercially available first generation SiGe BiCMOS process in designing circuits suitable for extreme environment applications.