Cite
APA Citation
Kim, Y., & Hong, S. (2021). dEMINER: test generation for high test coverage through mutant exploration. Software testing, verification & reliability, 31, n/a. http://access.bl.uk/ark:/81055/vdc_100121849184.0x000041
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Kim, Y., & Hong, S. (2021). dEMINER: test generation for high test coverage through mutant exploration. Software testing, verification & reliability, 31, n/a. http://access.bl.uk/ark:/81055/vdc_100121849184.0x000041