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APA Citation
Yan, A., He, Z., Zhou, J., Cui, J., Ni, T., Huang, Z., Wen, X., & Girard, P. (2021). dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications. Microelectronics journal, 111, . http://access.bl.uk/ark:/81055/vdc_100129512045.0x000056