Cite
HARVARD Citation
Li, Z. et al. (2019). Modelling and kink correction of 0.18μm bulk CMOS at liquid helium temperature. Electronics letters. 55 (14), pp. 780-783. [Online].
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Li, Z. et al. (2019). Modelling and kink correction of 0.18μm bulk CMOS at liquid helium temperature. Electronics letters. 55 (14), pp. 780-783. [Online].