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APA Citation
Lavini, F., Yang, N., Vasudevan, R. K., Strelcov, E., Jesse, S., Okatan, M. B., Kravchenko, I., Di Castro, D., Kalinin, S. V., Balestrino, G., Aruta, C., & Foglietti, V. (2015). bias assisted scanning probe microscopy direct write lithography enables local oxygen enrichment of lanthanum cuprates thin films. Nanotechnology, 26, . http://access.bl.uk/ark:/81055/vdc_100061666844.0x00002d