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HARVARD Citation
Lavini, F. et al. (2015). Bias assisted scanning probe microscopy direct write lithography enables local oxygen enrichment of lanthanum cuprates thin films. Nanotechnology. p. . [Online].
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Lavini, F. et al. (2015). Bias assisted scanning probe microscopy direct write lithography enables local oxygen enrichment of lanthanum cuprates thin films. Nanotechnology. p. . [Online].