Cite
HARVARD Citation
Moldovan, O. et al. (2015). Experimentally verified drain‐current model for variable barrier transistor. Electronics letters. 51 (17), pp. 1364-1366. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Moldovan, O. et al. (2015). Experimentally verified drain‐current model for variable barrier transistor. Electronics letters. 51 (17), pp. 1364-1366. [Online].