Cite
HARVARD Citation
Li, G. et al. (2018). Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point. Chinese journal of electronics. 27 (4), pp. 873-878. [Online].
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Li, G. et al. (2018). Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point. Chinese journal of electronics. 27 (4), pp. 873-878. [Online].