Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point. Issue 4 (1st July 2018)

• Record Type: Journal Article
• Authors: Li, Gang; Wang, Pengjun; Qian, Haoyu
• Is Part Of: Chinese journal of electronics. Volume 27:Issue 4(2018)
• Page Start: 873
• Page End: 878
• Publication Date: 2018-07-01
• Subjects: Physical unclonable function (PUF) -- Zero temperature coefficient (ZTC) -- Multiport -- Circuit design; CMOS integrated circuits -- integrated circuit design -- integrated circuit reliability -- MOSFET -- multiport networks; unclonability -- highly reliable multiport PUF scheme -- MOSFET Zero temperature coefficient point -- input register -- deviation‐current generating module -- arbiter array -- obfuscation circuit -- PUF circuit updates keys -- physical replacement -- multibit keys -- TSMC‐LP 65nm CMOS technology -- good statistical characteristic -- temperature variation -- voltage variation -- highly reliable multiport PUF circuit -- processing variations -- design parameters -- Physical unclonable function -- security keys -- MOSFET ZTC point -- reconfigurable PUF -- temperature ‐40.0 degC to 125.0 degC -- voltage 1.08 V to 1.32 V -- size 65.0 nm; Electronics -- Periodicals; Electronics -- China -- Periodicals; Electronics; China; Periodicals; 621.38105
• DOI: 10.1049/cje.2018.02.011
• Languages: English
• ISSNs: 1022-4653

Abstract

Abstract : By using processing variations in the unitcircuits of the same structures and design parameters during manufacturing, Physical unclonable function (PUF) generates security keys with characteristic of uniqueness, randomness and unclonability. In this paper, a highly reliable multiport PUF scheme was proposed based on MOSFET Zero temperature coefficient (ZTC) point. It consists of input register, deviation‐current generating module, arbiter array and obfuscation circuit. After reconfiguring deviation‐current generating module by applying different input challenges, the PUF circuit updates keys without physical replacement. And multi‐bit keys can be generated in one clock cycle. In TSMC‐LP 65nm CMOS technology, the layout of 64‐port reconfigurable PUF occupies 131 μmx242μm with custom designing. Experimental results show that the PUF circuit has good statistical characteristic of uniqueness and randomness. It exhibits high reliability of 98.2% with respect to temperature variation from ‐40°C to 125°C and supply voltage variation from 1.08V to 1.32V, indicating that it can be reliably and effectively used in information security field.